A PCB Micro-Defect Detection Method Based on Mult-Scale Feature Enhancement and Background Suppression. Academic Journal of Emerging Technologies, [S. l.], v. 2, n. 2, p. 29–50, 2026. DOI: 10.63313/AJET.9035. Disponível em: https://academics.erytis.com/index.php/AJET/article/view/339. Acesso em: 6 mar. 2026.