Solving Strategy for Silicon Carbide Epitaxial Layer Thickness Based on Nonlinear Least Squares Method. Frontiers in Engineering, [S. l.], v. 1, n. 1, p. 45–48, 2025. DOI: 10.63313/FE.9001. Disponível em: https://academics.erytis.com/index.php/fe/article/view/143. Acesso em: 17 nov. 2025.