A Survey of Semi-supervised and Unsupervised Learning Methods for Industrial Defect Anomaly Detection. Journal of Computer Science and Frontier Technologies, [S. l.], v. 1, n. 1, p. 1–15, 2025. DOI: 10.63313/JCSFT.9001. Disponível em: https://academics.erytis.com/index.php/jcsft/article/view/16. Acesso em: 3 aug. 2025.